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Other articles related with "electronic nematic fluctuations"：
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57402 |
Ding Hu(胡定), Wenliang Zhang(张汶良), Yuan Wei(魏源), Xiaotian Zhang(张笑天), Cong Ren(任聪), Lei Shan(单磊), Yi-feng Yang(杨义峰), Huiqian Luo(罗会仟), Shiliang Li(李世亮) |
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Effect of residual stress on nematic domains in BaFe2-xNixAs2 studied by angular magnetoresistance |
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Chin. Phys. B
2016 Vol.25 (5): 57402-057402
[Abstract]
(812)
[HTML 1 KB]
[PDF 303 KB]
(437)
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